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"Structural fault collapsing by superposition of BDDs for test generation ..."

Raimund Ubar et al. (2010)

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DOI: 10.1109/ISQED.2010.5450451

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Raimund Ubar, Dmitri Mironov, Jaan Raik, Artur Jutman:
Structural fault collapsing by superposition of BDDs for test generation in digital circuits. ISQED 2010: 250-257

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