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"Use of scalable Parametric Measurement Macro to improve semiconductor ..."

Jeanne Bickford et al. (2010)

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DOI: 10.1109/ISQED.2010.5450445

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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Jeanne Bickford, Nazmul Habib, John Goss, Robert McMahon, Rajiv V. Joshi, Rouwaida Kanj:
Use of scalable Parametric Measurement Macro to improve semiconductor technology characterization and product test. ISQED 2010: 315-319

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