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"An Improved Genetic Algorithm for Generation of Pairwise Combination Test ..."

Lihong Tan et al. (2022)

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DOI: 10.1109/ISCSIC57216.2022.00055

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-25

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Lihong Tan, Yan Sun, Ya Pan, Yong Fan:
An Improved Genetic Algorithm for Generation of Pairwise Combination Test Cases. ISCSIC 2022: 226-231

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