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"Software defect prediction using static code metrics underestimates ..."

David Gray et al. (2010)

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DOI: 10.1109/IJCNN.2010.5596650

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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  - conf/ijcnn/GrayBDSC10
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David Gray, David Bowes, Neil Davey, Yi Sun, Bruce Christianson:
Software defect prediction using static code metrics underestimates defect-proneness. IJCNN 2010: 1-7

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