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"Simulation Studies of Two-Layer Hopfield Neural Networks for Automatic ..."

Chuan-Yu Chang, Hung-Jen Wang, Si-Yan Lin (2006)

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DOI: 10.1007/11779568_119

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-19

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Chuan-Yu Chang, Hung-Jen Wang, Si-Yan Lin:
Simulation Studies of Two-Layer Hopfield Neural Networks for Automatic Wafer Defect Inspection. IEA/AIE 2006: 1119-1126

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