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"Defect-oriented testing of analogue and mixed signal ICs."

Marcelino B. Santos et al. (1998)

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DOI: 10.1109/ICECS.1998.814913

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-05

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  dblp key:
  - conf/icecsys/SantosGOT98
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  - https://dblp.org/rec/conf/icecsys/SantosGOT98
Marcelino B. Santos, Fernando M. Gonçalves, Michael J. Ohletz, João Paulo Teixeira:
Defect-oriented testing of analogue and mixed signal ICs. ICECS 1998: 419-424

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