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"Managing test coverage uncertainty due to thermal noise in nano-CMOS: A ..."

Vikram B. Suresh, Sandip Kundu (2013)

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DOI: 10.1109/ICCD.2013.6657043

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Vikram B. Suresh, Sandip Kundu:
Managing test coverage uncertainty due to thermal noise in nano-CMOS: A case-study on an SRAM array. ICCD 2013: 201-206

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