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"Efficient Yield Analysis for SRAM and Analog Circuits using Meta-Model ..."

Xiao Shi et al. (2019)

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DOI: 10.1109/ICCAD45719.2019.8942069

access: closed

type: Conference or Workshop Paper

metadata version: 2024-01-11

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Xiao Shi, Hao Yan, Jiajia Zhang, Qiancun Huang, Longxing Shi, Lei He:
Efficient Yield Analysis for SRAM and Analog Circuits using Meta-Model based Importance Sampling Method. ICCAD 2019: 1-8

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