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"FeatEMD: Better Patch Sampling and Distance Metric for Few-Shot Image ..."

Shisheng Deng et al. (2023)

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DOI: 10.1007/978-3-031-44207-0_16

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-02

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  dblp key:
  - conf/icann/DengLGZY23
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  - https://dblp.org/rec/conf/icann/DengLGZY23
Shisheng Deng, Dongping Liao, Xitong Gao, Juanjuan Zhao, Kejiang Ye:
FeatEMD: Better Patch Sampling and Distance Metric for Few-Shot Image Classification. ICANN (1) 2023: 183-194

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