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"Hall mobility study of hall structures in two different CMOS technological ..."

Maria-Alexandra Paun (2017)

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DOI: 10.1109/EUROCON.2017.8011111

access: closed

type: Conference or Workshop Paper

metadata version: 2017-08-24

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Maria-Alexandra Paun:
Hall mobility study of hall structures in two different CMOS technological processes. EUROCON 2017: 234-238

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