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"The defect-centric perspective of device and circuit reliability - From ..."

Ben Kaczer et al. (2015)

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DOI: 10.1109/ESSDERC.2015.7324754

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-19

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  dblp key:
  - conf/essderc/KaczerFWRBCDLGK15
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  - https://dblp.org/rec/conf/essderc/KaczerFWRBCDLGK15
Ben Kaczer, Jacopo Franco, Pieter Weckx, Philippe Roussel, Erik Bury, Moonju Cho, Robin Degraeve, Dimitri Linten, Guido Groeseneken, Halil Kukner, Praveen Raghavan, Francky Catthoor, Gerhard Rzepa, Wolfgang Gös, Tibor Grasser:
The defect-centric perspective of device and circuit reliability - From individual defects to circuits. ESSDERC 2015: 218-225

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