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"Stochastic Modeling of Hot-Carrier Degradation in nFinFETs Considering the ..."

Alexander Makarov et al. (2019)

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DOI: 10.1109/ESSDERC.2019.8901721

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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  - conf/essderc/MakarovLTKRCVHE19
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  - https://dblp.org/rec/conf/essderc/MakarovLTKRCVHE19
Alexander Makarov, Dimitri Linten, Stanislav Tyaginov, Ben Kaczer, Philippe Roussel, Adrian Vaisman Chasin, Michiel Vandemaele, Geert Hellings, Al-Moatasem El-Sayed, Markus Jech, Tibor Grasser:
Stochastic Modeling of Hot-Carrier Degradation in nFinFETs Considering the Impact of Random Traps and Random Dopants. ESSDERC 2019: 262-265

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