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"IoTaint: An Optimized Static Taint Analysis Method in Embedded Firmware."

Huan Yu, Baojiang Cui (2024)

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DOI: 10.1007/978-3-031-53555-0_12

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-21

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  dblp key:
  - conf/eidwt/YuC24
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Huan Yu, Baojiang Cui:
IoTaint: An Optimized Static Taint Analysis Method in Embedded Firmware. EIDWT 2024: 118-129

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