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"Cryogenic Characterization of Antiferroelectric Zirconia down to 50 mK."
Zheng Wang et al. (2019)
- Zheng Wang, Hanbin Ying, Nujhat Tasneem, Anthony Gaskell, John D. Cressler, Martin Mourigal, Asif Islam Khan:
Cryogenic Characterization of Antiferroelectric Zirconia down to 50 mK. DRC 2019: 85-86
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