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"On-chip Scan-Based Test Strategy for a Dependable Many-Core Processor ..."

Xiao Zhang, Hans G. Kerkhoff, Bart Vermeulen (2010)

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DOI: 10.1109/DSD.2010.16

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Xiao Zhang, Hans G. Kerkhoff, Bart Vermeulen:
On-chip Scan-Based Test Strategy for a Dependable Many-Core Processor Using a NoC as a Test Access Mechanism. DSD 2010: 531-537

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