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"Targeting different defect-oriented fault models in IC testing: an ..."

Nunzio Mirabella et al. (2023)

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DOI: 10.1109/DSD60849.2023.00039

access: closed

type: Conference or Workshop Paper

metadata version: 2024-04-02

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  dblp key:
  - conf/dsd/MirabellaFCGR23
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Nunzio Mirabella, Andrea Floridia, Riccardo Cantoro, Michelangelo Grosso, Matteo Sonza Reorda:
Targeting different defect-oriented fault models in IC testing: an experimental approach. DSD 2023: 214-219

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