default search action

combined dblp search
author search
venue search
publication search

ask others

"DNAttest: Digital-twin-based Non-intrusive Attestation under Transient ..."

Wei Lin et al. (2023)

> Home

Details and statistics

DOI: 10.1109/DSN58367.2023.00044

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/dsn/LinTCZ23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dsn/LinTCZ23
Wei Lin, Heng Chuan Tan, Binbin Chen, Fan Zhang:
DNAttest: Digital-twin-based Non-intrusive Attestation under Transient Uncertainty. DSN 2023: 376-388

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.