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"Simulation Methodology for Assessing X-Ray Effects on Digital Circuits."

Nasr-Eddine Ouldei Tebina et al. (2023)

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DOI: 10.1109/DFT59622.2023.10313564

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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  dblp key:
  - conf/dft/TebinaZHM23
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  - https://dblp.org/rec/conf/dft/TebinaZHM23
Nasr-Eddine Ouldei Tebina, Nacer-Eddine Zergainoh, Guillaume Hubert, Paolo Maistri:
Simulation Methodology for Assessing X-Ray Effects on Digital Circuits. DFT 2023: 1-6

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