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"Analog Test Interface for IEEE 1687 Employing Split SAR Architecture to ..."

Jerrin Pathrose, Leon van de Logt, Hans G. Kerkhoff (2019)

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DOI: 10.1109/DFT.2019.8875372

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-22

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Jerrin Pathrose, Leon van de Logt, Hans G. Kerkhoff:
Analog Test Interface for IEEE 1687 Employing Split SAR Architecture to Support Embedded Instrument Dependability Applications. DFT 2019: 1-4

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