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"IEEE 1149.1 Based Defect and Fault Tolerant Scan Chain for Wafer Scale ..."

Meng Lu et al. (2003)

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DOI: 10.1109/DFTVS.2003.1250091

access: closed

type: Conference or Workshop Paper

metadata version: 2024-03-05

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  - https://dblp.org/rec/conf/dft/LuSQT03
Meng Lu, Yvon Savaria, Bing Qiu, Jacques Taillefer:
IEEE 1149.1 Based Defect and Fault Tolerant Scan Chain for Wafer Scale Integration. DFT 2003: 18-25

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