Abstract. This paper presents an IEEE 1149.1 based defect and fault tolerant scan chain usable for testing and configuring large area and wafer scale ...

This paper presents an IEEE 1149.1 based defect and fault tolerant scan chain usable for testing and configuring large area and wafer scale integrated ...

Nov 3, 2003 · This paper presents an IEEE 1149.1 based defect and fault tolerant scan chain usable for testing and configuring large area and wafer scale ...

11. IEEE 1149.1 Based Defect and Fault Tolerant Scan Chain for Wafer Scale Integration pp. 18. Calibration of Open Interconnect Yield Models pp. 26. Yield ...

This paper presents an IEEE 1149.1 based defect and fault tolerant scan chain usable for testing and configuring large area and wafer scale integrated ...

Meng Lu, Yvon Savaria, Bing Qiu, Jacques Taillefer: IEEE 1149.1 Based Defect and Fault Tolerant Scan Chain for Wafer Scale Integration.

Apr 25, 2024 · Meng Lu, Yvon Savaria, Bing Qiu, Jacques Taillefer: IEEE 1149.1 Based Defect and Fault Tolerant Scan Chain for Wafer Scale Integration.

To surpass these constraints, we introduce a new test methodology based on JTAG and IEEE 1149.1 Std. ... Based Defect and Fault Tolerant Scan Chain for Wafer.

The proliferation of IEEE 1149.1 supported devices is helping Design for Test (DfT) engineers solve complex test access problems during board test. As ICs ...

IEEE 1149.1 Based Defect and Fault Tolerant Scan Chain for Wafer Scale Integration. ... Implementation and Testing of Fault-Tolerant Photodiode-Based Active Pixel ...