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"Third IEEE International Workshop on Electronic Design, Test and ..."

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DOI: —

access: closed

type: Editorship

metadata version: 2019-10-16

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  - conf/delta/2006
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  - https://dblp.org/rec/conf/delta/2006
Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2006), 17-19 January 2006, Kuala Lumpur, Malaysia. IEEE Computer Society 2006, ISBN 0-7695-2500-8 [contents]

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