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"Incorporation of Hard-Fault-Coverage in Model-Based Testing of ..."

Carsten Wegener, Michael Peter Kennedy (2000)

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DOI: 10.1109/DATE.2000.840898

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/date/WegenerK00
Carsten Wegener, Michael Peter Kennedy:
Incorporation of Hard-Fault-Coverage in Model-Based Testing of Mixed-Signal ICs. DATE 2000: 765

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