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"A BIST Scheme for On-Chip ADC and DAC Testing."

Jiun-Lang Huang, Chee-Kian Ong, Kwang-Ting Cheng (2000)

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DOI: 10.1109/DATE.2000.840041

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Jiun-Lang Huang, Chee-Kian Ong, Kwang-Ting Cheng:
A BIST Scheme for On-Chip ADC and DAC Testing. DATE 2000: 216-220

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