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"Jump test for metallic CNTs in CNFET-based SRAM."

Feng Xie et al. (2015)

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DOI: 10.1145/2744769.2744864

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-21

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  - conf/dac/XieLXCJJ15
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  - https://dblp.org/rec/conf/dac/XieLXCJJ15
Feng Xie, Xiaoyao Liang, Qiang Xu, Krishnendu Chakrabarty, Naifeng Jing, Li Jiang:
Jump test for metallic CNTs in CNFET-based SRAM. DAC 2015: 16:1-16:6

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