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"A voltage drop aware crosstalk measurement with multi-aggressors in 65nm ..."

Genichi Tanaka et al. (2008)

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DOI: 10.1109/CICC.2008.4672015

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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Genichi Tanaka, Kan Takeuchi, Minoru Ito, Hiroaki Matsushita:
A voltage drop aware crosstalk measurement with multi-aggressors in 65nm process. CICC 2008: 37-40

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