default search action

combined dblp search
author search
venue search
publication search

ask others

"A methodology for measurement and characterization of substrate noise in ..."

Ranjit Gharpurey (1999)

> Home

Details and statistics

DOI: 10.1109/CICC.1999.777328

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-29

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/cicc/Gharpurey99
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/cicc/Gharpurey99
Ranjit Gharpurey:
A methodology for measurement and characterization of substrate noise in high frequency circuits. CICC 1999: 487-490

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.