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"A genetic programming approach to modeling power losses of Insulate Gate ..."

Nicola Femia, Mario Migliaro, Antonio Della Cioppa (2016)

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DOI: 10.1109/CEC.2016.7744391

access: closed

type: Conference or Workshop Paper

metadata version: 2019-09-25

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Nicola Femia, Mario Migliaro, Antonio Della Cioppa:
A genetic programming approach to modeling power losses of Insulate Gate Bipolar Transistors. CEC 2016: 4705-4712

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