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"Defect Detection from X-Ray Images Using A Three-Stage Deep Learning ..."

Jing Ren et al. (2019)

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DOI: 10.1109/CCECE.2019.8861944

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-05

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  dblp key:
  - conf/ccece/RenRGH19
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  - https://dblp.org/rec/conf/ccece/RenRGH19
Jing Ren, Rui Ren, Mark Green, Xishi Huang:
Defect Detection from X-Ray Images Using A Three-Stage Deep Learning Algorithm. CCECE 2019: 1-4

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