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"An extended march test algorithm for embedded memories."

Gang-Min Park, Hoon Chang (1997)

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DOI: 10.1109/ATS.1997.643990

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/ats/ParkC97
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  - https://dblp.org/rec/conf/ats/ParkC97
Gang-Min Park, Hoon Chang:
An extended march test algorithm for embedded memories. Asian Test Symposium 1997: 404-409

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