default search action

combined dblp search
author search
venue search
publication search

ask others

"Peak-power reduction for multiple-scan circuits during test application."

Kuen-Jong Lee, Tsung-Chu Huang, Jih-Jeen Chen (2000)

> Home

Details and statistics

DOI: 10.1109/ATS.2000.893666

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/ats/LeeHC00
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ats/LeeHC00
Kuen-Jong Lee, Tsung-Chu Huang, Jih-Jeen Chen:
Peak-power reduction for multiple-scan circuits during test application. Asian Test Symposium 2000: 453-458

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.