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"P^(2)CLRAF: An Pre- and Post-Silicon Cooperated Circuit Lifetime ..."

Song Jin et al. (2010)

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DOI: 10.1109/ATS.2010.29

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-23

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Song Jin, Yinhe Han, Huawei Li, Xiaowei Li:
P^(2)CLRAF: An Pre- and Post-Silicon Cooperated Circuit Lifetime Reliability Analysis Framework. Asian Test Symposium 2010: 117-120

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