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"An Effective At-Speed Scan Testing Approach Using Multiple-Timing Clock ..."

Hiroyuki Iwata et al. (2012)

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DOI: 10.1109/ATS.2012.39

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/ats/IwataMMT12
Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima, Masahiro Takakura:
An Effective At-Speed Scan Testing Approach Using Multiple-Timing Clock Waveforms. Asian Test Symposium 2012: 1

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