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"Interplay of Failure Rate, Performance, and Test Cost in TCAM under ..."

Hsunwei Hsiung et al. (2013)

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DOI: 10.1109/ATS.2013.54

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-22

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  - conf/ats/HsiungC0GG13
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  - https://dblp.org/rec/conf/ats/HsiungC0GG13
Hsunwei Hsiung, Da Cheng, Bin Liu, Ramesh Govindan, Sandeep K. Gupta:
Interplay of Failure Rate, Performance, and Test Cost in TCAM under Process Variations. Asian Test Symposium 2013: 251-258

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