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"Leveraging Partially Enhanced Scan for Improved Observability in Delay ..."

K. G. Deepak et al. (2009)

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DOI: 10.1109/ATS.2009.78

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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K. G. Deepak, Robinson Reyna, Virendra Singh, Adit D. Singh:
Leveraging Partially Enhanced Scan for Improved Observability in Delay Fault Testing. Asian Test Symposium 2009: 237-240

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