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"A Statistical Approach to Area-Constrained Yield Enhancement for Pipelined ..."

Animesh Datta et al. (2005)

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DOI: 10.1109/ATS.2005.16

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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Animesh Datta, Swarup Bhunia, Saibal Mukhopadhyay, Kaushik Roy:
A Statistical Approach to Area-Constrained Yield Enhancement for Pipelined Circuits under Parameter Variations. Asian Test Symposium 2005: 170-175

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