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"BIST TPG for Combinational Cluster (Glue Logic) Interconnect Testing at ..."

Chen-Huan Chiang, Sandeep K. Gupta (1998)

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DOI: 10.1109/ATS.1998.741620

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-22

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Chen-Huan Chiang, Sandeep K. Gupta:
BIST TPG for Combinational Cluster (Glue Logic) Interconnect Testing at Board Level. Asian Test Symposium 1998: 244-252

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