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"Study on Single Event Burnout Effect for 18V LDMOS Based on 0.18µm ..."

Langtao Chen et al. (2022)

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DOI: 10.1109/APCCAS55924.2022.10090399

access: closed

type: Conference or Workshop Paper

metadata version: 2023-04-22

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  dblp key:
  - conf/apccas/ChenZWKXPMQZ22
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  - https://dblp.org/rec/conf/apccas/ChenZWKXPMQZ22
Langtao Chen, Xin Zhou, Ying Wang, Ying Kong, Rubin Xie, Ling Peng, Yantu Mo, Ming Qiao, Bo Zhang:
Study on Single Event Burnout Effect for 18V LDMOS Based on 0.18µm Process Technology. APCCAS 2022: 588-591

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