default search action

combined dblp search
author search
venue search
publication search

ask others

"A Cost Effective Test Screening Circuit for embedded SRAM with Resume ..."

Yoshisato Yokoyama et al. (2019)

> Home

Details and statistics

DOI: 10.1109/A-SSCC47793.2019.9056978

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-19

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/asscc/YokoyamaGMONINT19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/asscc/YokoyamaGMONINT19
Yoshisato Yokoyama, Kenji Goto, Tomohiro Miura, Yukari Ouchi, Daisuke Nakamura, Jiro Ishikawa, Shunya Nagata, Yoshiki Tsujihashi, Yuichiro Ishii:
A Cost Effective Test Screening Circuit for embedded SRAM with Resume Standby on 110-nm SoC/MCU. A-SSCC 2019: 17-20

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.