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"Fast statistical analysis of rare failure events for memory circuits in ..."

Shupeng Sun, Xin Li (2015)

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DOI: 10.1109/ASPDAC.2015.7059022

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Shupeng Sun, Xin Li:
Fast statistical analysis of rare failure events for memory circuits in high-dimensional variation space. ASP-DAC 2015: 302-307

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