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"Correlation method of circuit-performance and technology fluctuations for ..."

D. Miyawaki et al. (2001)

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DOI: 10.1145/370155.370260

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  - conf/aspdac/MiyawakiMMOSMKYYN01
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  - https://dblp.org/rec/conf/aspdac/MiyawakiMMOSMKYYN01
D. Miyawaki, Shizunori Matsumoto, Hans Jürgen Mattausch, S. Ooshiro, Masami Suetake, Mitiko Miura-Mattausch, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama:
Correlation method of circuit-performance and technology fluctuations for improved design reliability. ASP-DAC 2001: 39-44

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