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"Non-linear analog circuit test and diagnosis under process variation using ..."

Suraj Sindia, Vishwani D. Agrawal, Virendra Singh (2011)

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DOI: 10.1109/VTS.2011.5783756

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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  dblp key:
  - conf/vts/SindiaAS11
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Suraj Sindia, Vishwani D. Agrawal, Virendra Singh:
Non-linear analog circuit test and diagnosis under process variation using V-Transform coefficients. VTS 2011: 64-69

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