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"High efficient low cost EEPROM screening method in combination with an ..."

Gregor Schatzberger et al. (2018)

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DOI: 10.1109/VTS.2018.8368631

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - conf/vts/SchatzbergerLSW18
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  - https://dblp.org/rec/conf/vts/SchatzbergerLSW18
Gregor Schatzberger, Friedrich Peter Leisenberger, Peter Sarson, Andreas Wiesner:
High efficient low cost EEPROM screening method in combination with an area optimized byte replacement strategy which enables high reliability EEPROMs. VTS 2018: 1-6

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