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"Effective and Efficient Test Pattern Generation for Small Delay Defect."

Sandeep Kumar Goel, Narendra Devta-Prasanna, Ritesh P. Turakhia (2009)

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DOI: 10.1109/VTS.2009.28

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - conf/vts/GoelDT09
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  - https://dblp.org/rec/conf/vts/GoelDT09
Sandeep Kumar Goel, Narendra Devta-Prasanna, Ritesh P. Turakhia:
Effective and Efficient Test Pattern Generation for Small Delay Defect. VTS 2009: 111-116

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