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"Extraction of threshold voltage degradation modeling due to Negative Bias ..."

Soonyoung Cha et al. (2014)

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DOI: 10.1109/VTS.2014.6818769

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/ChaCLM14
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  persistent URL:
  - https://dblp.org/rec/conf/vts/ChaCLM14
Soonyoung Cha, Chang-Chih Chen, Taizhi Liu, Linda S. Milor:
Extraction of threshold voltage degradation modeling due to Negative Bias Temperature Instability in circuits with I/O measurements. VTS 2014: 1-6

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