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"High Performance 5G Mobile SOC Productization with 4nm EUV Fin-FET Technology."

Jun Yuan et al. (2023)

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DOI: 10.23919/VLSITECHNOLOGYANDCIR57934.2023.10185435

access: closed

type: Conference or Workshop Paper

metadata version: 2023-07-28

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  - conf/vlsit/YuanDLCCLCZCLYW23
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  - https://dblp.org/rec/conf/vlsit/YuanDLCCLCZCLYW23
Jun Yuan, Jie Deng, Vicki Lin, Ying Chen, Joseph Chiu, Minghuei Lin, Jun Chen, Deedee Zhang, Yukai Chen, David Liu, Bo Yu, Hao Wang, Giri Nallapati, Vivek Mohan, Venu Sanaka, Berkan Baran, Frank Dahan, Prasad Bhadri, Rajesh Geol, Venu Boynapalli, Seyfi Bazarjani, Paul Penzes, Parag Agashe, P. R. Chidambaram:
High Performance 5G Mobile SOC Productization with 4nm EUV Fin-FET Technology. VLSI Technology and Circuits 2023: 1-2

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