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"SCARE: Side-Channel Analysis Based Reverse Engineering for Post-Silicon ..."

Xinmu Wang et al. (2012)

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DOI: 10.1109/VLSID.2012.88

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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Xinmu Wang, Seetharam Narasimhan, Aswin Raghav Krishna, Swarup Bhunia:
SCARE: Side-Channel Analysis Based Reverse Engineering for Post-Silicon Validation. VLSI Design 2012: 304-309

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