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"An NoC Test Strategy Based on Flooding with Power, Test Time and Coverage ..."

Mahshid Sedghi et al. (2008)

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DOI: 10.1109/VLSI.2008.111

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vlsid/SedghiKAFN08
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  - https://dblp.org/rec/conf/vlsid/SedghiKAFN08
Mahshid Sedghi, Elnaz Koopahi, Armin Alaghi, Mahmood Fathy, Zainalabedin Navabi:
An NoC Test Strategy Based on Flooding with Power, Test Time and Coverage Considerations. VLSI Design 2008: 409-414

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