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"Fast, Layout-Aware Validation of Test-Vectors for Nanometer-Related Timing ..."

Aman Kokrady, C. P. Ravikumar (2004)

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DOI: 10.1109/ICVD.2004.1260984

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Aman Kokrady, C. P. Ravikumar:
Fast, Layout-Aware Validation of Test-Vectors for Nanometer-Related Timing Failures. VLSI Design 2004: 597-

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