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"On Guaranteeing Capture Safety in At-Speed Scan Testing with ..."

Kazunari Enokimoto et al. (2013)

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DOI: 10.1109/VLSID.2013.201

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/vlsid/EnokimotoWMHKW13
Kazunari Enokimoto, Xiaoqing Wen, Kohei Miyase, Jiun-Lang Huang, Seiji Kajihara, Laung-Terng Wang:
On Guaranteeing Capture Safety in At-Speed Scan Testing with Broadcast-Scan-Based Test Compression. VLSI Design 2013: 279-284

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